Magma EFI

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品牌:Neocera

Magma EFI includes the highly sensitive SQUID sensor for low current, non-destructive inspection of shorts, leakages and high-resistance opens. Additionally, the EFI tool can detect dead open faults with fantastic accuracy.

 

Feature Details
SQUID
Short Defect Localization (SQUID) 3um
Spatial Resolution (SQUID) 2um
Total Scanning Area (SQUID) At least 100mm by 100mm
Current Sensitivity (SQUID)
  • 500nA @ 333um
  • 1.5uA @ 1000um
Magnetic Sensitivity (SQUID) 15 pT/√Hz Typical
Imaging Depth (SQUID) 10mm
Operating Frequency (SQUID) DC to 25kHz
Opens
Opens Defect Localization (SDR) 30um
Imaging Depth (Opens) <500um
Operating Frequency (Opens) 20MHz to 200MHz
General
IF Function Generator ±10V @ 100mA
IF Function Generator Frequency DC to 200kHz
Camera Resolution 2um (in NIR or Visible)
System Power
  • 110 - 120V @ 20A
  • 220 - 240V@ 10A
System Operating System Windows 10 64-bit

 

Cost-Effective localization of leakages, shorts and opens in device packages and PCB

The Magma Electronic Fault Isolation (EFI) system is complete package detecting all types of static defects (shorts, leakages, high resistance opens and dead opens) at the package or PC board level (for die level defects, see the EFI HiRes tool). The Magma EFI system extends the features of the Magma SSM tool by adding a technique called space domain reflectometry (SDR). This technique uses radio frequency (RF) standing waves inside of the device to localize dead opens in devices ranging from PC boards to stacked devices and multi-chip modules.

The Magma EFI also features all the capabilities of the Magma SSM tool. The Magma EFI tool utilizes a super-conducting quantum interference device, or SQUID, to detect currents in devices requiring only nanoamps of current. These currents are assembled into an image which can be used in conjunction with optical fiducials and design data to localize static defects in three dimensions.

Imaging with the SQUID is non-destructive. As magnetic fields permeate most materials used in typical devices, there is no need to deprocess the device in any way to begin localizing the failure. Additionally, using such small currents can protect the device under test from further damage and may be the only option when trying to detect failures in circuits with very high resistance (>100kΩ). Typical failures that can be analyzed with the EFI tool include shortsleakagesresistive opens and dead opens. The system can be used to image AC and/or DC magnetic fields (and likewise, currents) depending on the requirements of the device.

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